12:30PM –12:55PM

Abstract:
A novel non-contact optical profiler has been designed to handle surface metrology on samples that were previously beyond the reach on conventional optical profilers such as confocal microscopes and interferometers. This new technique based on Zeta's patented ZDot(TM) technique allows users to simultaneously collect surface profile information with the true color image of the surface. The versatile platform also accommodates a conventional Atomic Force Microscope as well as an Interferometer, thus covering a large number of applications. Examples of measurements on solar cells, LED substrates and Microfluidic devices will be presented to highlight the difficult measurement problems solved by the Zeta Optical Profiler.

We will discuss:

• Texture analysis and True Color imaging of surfaces with very low relfectivity, very high roughness, large geometries.
• Optical profiling, Interferometry, Atomic Froce Microscopy, Thin Film Spectrometry
• Metrology of solar cells, LED substrates, Microfluidic, Data Storage and Bio-technology samples

Intended audience: R&D scientists and Manufacturing engineers in a wide variety of industries such as solar cells, high brightness LED, Microfluidic devices, Metrology, Tribology

About the speaker:
Ben Garland, Sales Director

Ben received his Degree in Chemistry. BS from Idaho State University and MS from the University of Utah. He started his career at Thermo Fisher (Nicolet FT-IR) in 1990. In 2009, he joined Zeta Instruments in San Jose, CA. He is responsible for the sales and applications development for Zeta's optical profilers. Ben has recently co-developed a unique technique to measure the surface roughness and height/depth of channels inside closed microfluidic (lab-on-a-chip) devices. His talk will cover the Zeta Optical Profiler applications for such difficult samples.