1:00PM –1:25PM
Abstract:
Introducing the world's first and only mixed domain oscilloscope. For the first time ever, you can capture time-correlated analog, digital and RF signals for a complete system view of your device. See both the time and frequency domain in a single glance. View the RF spectrum at any point in time to see how it changes with time or device state. Solve the most complicated design issues, quickly and efficiently, with an oscilloscope as integrated as your design. Transforming the way you test. Only from Tektronix.
We will discuss:
- RF uses continue to grow in a variety of non-traditional fields
- Learn about the worlds only mixed domain oscilloscope and testing tool that allows you to easily capture and evaluate time and frequency domains
Intended audience: Engineers and designers of products embedding RF in designs, test engineers and technicians seeking ways to quickly test RF designs
About the speaker:
Luis Hernandez, Applications Engineer
Luis Hernandez has a trajectory of 15 years in test and measurement as an applications engineer with Tektronix and Agilent Technologies/HP. He's been focused on RF and wireless devices test. His experience extends from mobile test, base station test and drive test and most recently he has incorporated the time domain into his RF knowledge when he joined Tektronix in 2004 where he has focused in the Tektronix Real Time Spectrum Analyzer, Tektronix high speed Arbitrary Waveform Generators and Wideband Oscilloscopes for RF Analysis. Luis has an Electronics Engineering degree from Simon Bolivar University in Caracas Venezuela. |
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